ide-smart - IDE SMART Checking tool
ide-smart [--help] [--version]
SMART stands for Self-Monitoring, Analysis and Reporting Technology, which provides near future failure prediction monitoring different attributes (listed as Id) of the device. If a value of a particular Id (or attribute) is under a certain threshold, the device most probabily will be about to fail.
There are two type of tests: online and offline. Online tests are periodically performed by the drive while it's being used, while offline tests can be performed only by manually starting an offline test.
Each test also has a severity associated with it: Advisory and PreFailure. Advisory indicates a possible failure, and PreFailure a Predictable Failure which is an "sure" failure in the near future. Predictable failures ar characterized by a degradation of an attribute over time mostly corresponding to mechanic causes (for example head flying height degradation would indicate an impending head crash).
The exact meaning of the attributes varies between manufacturers and even models, so it is impossible to decypher them (ranging through spin-up time to head flying height or throughput performance). At any rate, the value you should care upon is the last column, holding whether a test passed or failed.
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Created 1996-2021 by Maxim Chirkov
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